Details
- Title: 2019 IEEE 28th Asian Test Symposium (ATS 2019)
- Date/Location: Held 10-13 December 2019, Kolkata, India.
- IEEE #: CFP19067-POD
- ISBN: 9781728126968
- Pages: 166 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2020 )
Description
Members/Attendees
Tab 4
- Title: 2019 IEEE 28th Asian Test Symposium (ATS 2019)
- Date/Location: Held 10-13 December 2019, Kolkata, India.
- IEEE #: CFP19067-POD
- ISBN: 9781728126968
- Pages: 166 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2020 )