DEFECTS AND MATERIALS ISSUES IN SEMICONDUCTORS - RELATIONSHIP TO OPTOELECTRONIC PROPERTIES AND DEVICE RELIABILITY. (SYMPOSIUM CC/FF AT THE 2015 MRS SPRING MEETING AND EXHIBIT)

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  • Title: Defects and Materials Issues in Semiconductors - Relationship to Optoelectronic Properties and Device Reliability
  • Subtitle: Symposium CC/FF at the 2015 MRS Spring Meeting and Exhibit
  • Date/Location: Held 6-10 April 2015, San Francisco, California, USA.
  • Series: Materials Research Society Symposium Proceedings Volume 1792
  • Editor: Herrick, R. et al.
  • ISBN: 9781713808206
  • Pages: 136 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
  • POD Publisher: Curran Associates, Inc. ( May 2020 )

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  • Title: Defects and Materials Issues in Semiconductors - Relationship to Optoelectronic Properties and Device Reliability
  • Subtitle: Symposium CC/FF at the 2015 MRS Spring Meeting and Exhibit
  • Date/Location: Held 6-10 April 2015, San Francisco, California, USA.
  • Series: Materials Research Society Symposium Proceedings Volume 1792
  • Editor: Herrick, R. et al.
  • ISBN: 9781713808206
  • Pages: 136 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
  • POD Publisher: Curran Associates, Inc. ( May 2020 )