METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2024. (MetroXRAINE 2024) (2 VOLS)

METROLOGY FOR EXTENDED REALITY, ARTIFICIAL INTELLIGENCE AND NEURAL ENGINEERING. IEEE INTERNATIONAL CONFERENCE. 2024. (MetroXRAINE 2024) (2 VOLS)

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  • Title: 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2024)
  • Date/Location: Held 21-23 October 2024, St Albans, United Kingdom.
  • IEEE #: CFP24BQ1-POD
  • ISBN: 9798350378016
  • Pages: 1,247 (2 Vols)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2025 )

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Tab 4

 
  • Title: 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2024)
  • Date/Location: Held 21-23 October 2024, St Albans, United Kingdom.
  • IEEE #: CFP24BQ1-POD
  • ISBN: 9798350378016
  • Pages: 1,247 (2 Vols)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2025 )