the Physical and Failure Analysis of Integrated Circuits (IPFA), 2025 IEEE 32nd International Symposium on

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083137
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  • Title: 2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2025)
  • Date/Location: Held 5-8 August 2025, Bayan Lepas, Malaysia.
  • IEEE #: CFP25777-POD
  • ISBN: 9798331549435
  • Pages: 514 (1 Vol)
  • Format: Softcover
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2026 )

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  • Title: 2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2025)
  • Date/Location: Held 5-8 August 2025, Bayan Lepas, Malaysia.
  • IEEE #: CFP25777-POD
  • ISBN: 9798331549435
  • Pages: 514 (1 Vol)
  • Format: Softcover
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2026 )