FOURTH INTERNATIONAL CONFERENCE ON TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2024)

Item #:

078143

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Title: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024)
Date/Location: Held 27-29 September 2024, Xiamen, China.
Series: Proceedings of SPIE Volume 13439
Editor: Ye, Xuexia
ISBN: 9781510686649
Pages: 772 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jan 2025 )

Title: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024)
Date/Location: Held 27-29 September 2024, Xiamen, China.
Series: Proceedings of SPIE Volume 13439
Editor: Ye, Xuexia
ISBN: 9781510686649
Pages: 772 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jan 2025 )