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X-RAY NANOIMAGING: INSTRUMENTS AND METHODS VII
- Item #:
- 082838
- UPC:
Details
-
Title:
X-Ray Nanoimaging: Instruments and Methods VII
-
Subtitle:
At Optical Engineering + Applications
-
Date/Location:
Held 3-7 August 2025, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 13622
-
Editor:
Chu, Yong S.
-
ISBN:
9781510691520
-
Pages:
82 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Dec 2025 )
-
Title:
X-Ray Nanoimaging: Instruments and Methods VII
-
Subtitle:
At Optical Engineering + Applications
-
Date/Location:
Held 3-7 August 2025, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 13622
-
Editor:
Chu, Yong S.
-
ISBN:
9781510691520
-
Pages:
82 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Dec 2025 )