OPTICAL SENSING AND PRECISION METROLOGY II

OPTICAL SENSING AND PRECISION METROLOGY II

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085276
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Details

  • Title: Optical Sensing and Precision Metrology II
  • Subtitle: At OPTO
  • Date/Location: Held 20-22 January 2026, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 13914
  • Editor: Scheuer, Jacob
  • ISBN: 9781510697454
  • Pages: 128 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Apr 2026 )

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  • Title: Optical Sensing and Precision Metrology II
  • Subtitle: At OPTO
  • Date/Location: Held 20-22 January 2026, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 13914
  • Editor: Scheuer, Jacob
  • ISBN: 9781510697454
  • Pages: 128 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Apr 2026 )