FIFTH INTERNATIONAL CONFERENCE ON TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2025)

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085307

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Title: Fifth International Conference on Testing Technology and Automation Engineering (TTAE 2025)
Date/Location: Held 14-16 November 2025, Changsha, China.
Series: Proceedings of SPIE Volume 14127
Editor: Pekar, Libor
ISBN: 9798902322139
Pages: 502 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Apr 2026 )

Title: Fifth International Conference on Testing Technology and Automation Engineering (TTAE 2025)
Date/Location: Held 14-16 November 2025, Changsha, China.
Series: Proceedings of SPIE Volume 14127
Editor: Pekar, Libor
ISBN: 9798902322139
Pages: 502 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Apr 2026 )