Details
- Title: 15th Asian Test Symposium (ATS 2006)
- Date/Location: Held 20-23 November 2006, Fukuoka, Japan.
- IEEE #: CFP06067-POD
- ISBN: 9780769526287
- Pages: 451 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2007 )
Description
Members/Attendees
Tab 4
- Title: 15th Asian Test Symposium (ATS 2006)
- Date/Location: Held 20-23 November 2006, Fukuoka, Japan.
- IEEE #: CFP06067-POD
- ISBN: 9780769526287
- Pages: 451 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2007 )