Details
- Title: 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR 2016)
- Date/Location: Held 28-30 September 2016, Pensacola Beach, Florida, USA.
- IEEE #: CFP16AST-POD
- ISBN: 9781509018819
- Pages: 99 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2017 )
Description
Members/Attendees
Tab 4
- Title: 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR 2016)
- Date/Location: Held 28-30 September 2016, Pensacola Beach, Florida, USA.
- IEEE #: CFP16AST-POD
- ISBN: 9781509018819
- Pages: 99 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2017 )