Details
- Title: 2016 IEEE 25th Asian Test Symposium (ATS 2016)
- Date/Location: Held 21-24 November 2016, Hiroshima, Japan.
- IEEE #: CFP16067-POD
- ISBN: 9781509038107
- Pages: 318 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2017 )
Description
Members/Attendees
Tab 4
- Title: 2016 IEEE 25th Asian Test Symposium (ATS 2016)
- Date/Location: Held 21-24 November 2016, Hiroshima, Japan.
- IEEE #: CFP16067-POD
- ISBN: 9781509038107
- Pages: 318 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2017 )