Details
- Title: 2016 20th International Symposium on VLSI Design and Test (VDAT 2016)
- Date/Location: Held 24-27 May 2016, Guwahati, India.
- IEEE #: CFP1672Y-POD
- ISBN: 9781509014231
- Pages: 219 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Oct 2017 )
Description
Members/Attendees
Tab 4
- Title: 2016 20th International Symposium on VLSI Design and Test (VDAT 2016)
- Date/Location: Held 24-27 May 2016, Guwahati, India.
- IEEE #: CFP1672Y-POD
- ISBN: 9781509014231
- Pages: 219 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Oct 2017 )