Details
- Title: 2017 IEEE International Test Conference (ITC 2017)
- Date/Location: Held 31 October - 2 November 2017, Fort Worth, Texas, USA.
- IEEE #: CFP17ITC-POD
- ISBN: 9781538634141
- Pages: 485 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2018 )
Description
Members/Attendees
Tab 4
- Title: 2017 IEEE International Test Conference (ITC 2017)
- Date/Location: Held 31 October - 2 November 2017, Fort Worth, Texas, USA.
- IEEE #: CFP17ITC-POD
- ISBN: 9781538634141
- Pages: 485 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2018 )